| Topic: Device Characterization and Yield Management for Fabless Companies |
| Venue: ISE Labs, Inc., Fremont |
| Date: February 1, 2007 |
| Time: 11:30am - 1:00pm |
| Topic: Using Per-Pin TIA |
| (Lunch will be provided) |
| Agenda: |
| 1. Device characterization overview |
| 2. Ensuring a stable test program |
| 3. Ongoing yield monitoring and diagnosis |
| 4. Demonstration of Examinator for device characterization |
| Click the link below to register: |
| http://www.iselabs.com/Register |
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