- Service
- Field-Induced Charged Device Model (CDM)
- Simulates triboelectric and electrostatic charging/discharging events that occur in production equpiment and processes
- Human Body Model (HBM)
- Simulates electrostatic discharge that might occur when a human touches the test device
- Machine Model (MM)
- Simulates electrostatic discharge that might occur when a conductive object comes into contact with the test device
- Latch-Up/Electrical Overstress
- Determine latch-up characteristics to define product reliability and minimize No Trouble Found (NTF) and Electrical Overstress (EOS)
- Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies
- Latest Industry Standards
- CDM: JESD22-C101, ESDA DS5.3.1, AEC-Q100-011
- HBM: ESD/JEDEC JDS-001-2012, Mil-Std 883 (Method 3015), AEC-Q100-002
- MM: JESD22-A115, AEC-Q100-003, ESDA STM5.2
- Latch-up: JESD78/JESD78D, AEC Q100-004
- Equipment
- CDM test System
- ESD/Latch-up Test System
- Zapmaster MK.2
- Zapmaster MK.4
ISE Labs © 2013, All Rights Reserved
